Advanced Semiconductor Packaging 2.5D/3D

Integration of multiple dies with interposers, fan-out, wafer bonding, or vertical stacking to improve bandwidth, density, and yield.

Core metadata

Prerequisites

Dependents

Fields

Field lanes

Node sources

Prerequisite edge evidence

Edge/source evidence summary:

Prerequisite Type Confidence Evidence level Note Sources
Integrated Circuits (Microchips) (integrated_circuits) required 82% expert_inference Integrated Circuits (Microchips) is modeled as a necessary component or method for this technology in the current graph.
Precision Machine Tools (precision_machine_tools) enabling 68% expert_inference Precision Machine Tools provides a capability that enables this technology without being the only possible path.
Clean Rooms (clean_rooms) enabling 68% expert_inference Clean Rooms provides a capability that enables this technology without being the only possible path.
Through-Silicon Vias (through_silicon_vias) enabling 78% textbook Through-silicon vias are used in 2.5D/3D interconnect reference flows, but broad advanced packaging also includes approaches such as fan-out and wafer bonding.
Fan-Out Wafer-Level Packaging (fan_out_wafer_level_packaging) enabling 80% review Fan-out wafer-level packaging is a non-TSV advanced-packaging route that uses redistribution layers and reconstituted wafers or panels to integrate dies.
Hybrid Bonding Advanced Packaging (hybrid_bonding_advanced_packaging) enabling 78% review Hybrid bonding is a high-density 3D integration route for advanced packaging, distinct from fan-out and from TSV-only interposer flows.

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